
OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!
If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.
Requested Article:
Edge devices-oriented surface defect segmentation by GhostNet Fusion Block and Global Auxiliary Layer
Igi Ardiyanto
Journal of Real-Time Image Processing (2023) Vol. 21, Iss. 1
Closed Access | Times Cited: 4
Igi Ardiyanto
Journal of Real-Time Image Processing (2023) Vol. 21, Iss. 1
Closed Access | Times Cited: 4
Showing 4 citing articles:
WFF-Net: Trainable weight feature fusion convolutional neural networks for surface defect detection
Hongyong Xiao, Wei Zhang, Lei Zuo, et al.
Advanced Engineering Informatics (2024) Vol. 64, pp. 103073-103073
Closed Access | Times Cited: 3
Hongyong Xiao, Wei Zhang, Lei Zuo, et al.
Advanced Engineering Informatics (2024) Vol. 64, pp. 103073-103073
Closed Access | Times Cited: 3
A generic deep learning architecture optimization method for edge device based on start-up latency reduction
Qi Li, Hengyi Li, Lin Meng
Journal of Real-Time Image Processing (2024) Vol. 21, Iss. 4
Open Access | Times Cited: 1
Qi Li, Hengyi Li, Lin Meng
Journal of Real-Time Image Processing (2024) Vol. 21, Iss. 4
Open Access | Times Cited: 1
A YOLO Benchmarking Experiment For Maritime Object Detection In Foggy Environments
Defu Yang, Mahmud Iwan Solihin, Yawen Zhao, et al.
(2024), pp. 354-359
Closed Access | Times Cited: 1
Defu Yang, Mahmud Iwan Solihin, Yawen Zhao, et al.
(2024), pp. 354-359
Closed Access | Times Cited: 1
Detection of Scratch Defects on Metal Surfaces Based on MSDD-UNet
Yan Liu, Yunbai Qin, Zhonglan Lin, et al.
Electronics (2024) Vol. 13, Iss. 16, pp. 3241-3241
Open Access
Yan Liu, Yunbai Qin, Zhonglan Lin, et al.
Electronics (2024) Vol. 13, Iss. 16, pp. 3241-3241
Open Access