OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!
If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.
Requested Article:
Artificial Intelligence based Optimization with Extreme Gradient Boosting for Fabric Defect Detection and Classification Model
N. Sajitha, S. Prasanna Priya
2022 International Conference on Sustainable Computing and Data Communication Systems (ICSCDS) (2023), pp. 509-515
Closed Access | Times Cited: 6
N. Sajitha, S. Prasanna Priya
2022 International Conference on Sustainable Computing and Data Communication Systems (ICSCDS) (2023), pp. 509-515
Closed Access | Times Cited: 6
Showing 6 citing articles:
A Systematic Literature Review on Artificial Intelligence and Explainable Artificial Intelligence for Visual Quality Assurance in Manufacturing
Rudolf Hoffmann, Christoph Reich
Electronics (2023) Vol. 12, Iss. 22, pp. 4572-4572
Open Access | Times Cited: 10
Rudolf Hoffmann, Christoph Reich
Electronics (2023) Vol. 12, Iss. 22, pp. 4572-4572
Open Access | Times Cited: 10
Dictionary Learning Based Adaptive Defect Detection In Complex Fabric Textures
R. Subashini, R. Hemalatha, K Muthumeenakshi
International Journal of Computing and Digital Systems (2023) Vol. 14, Iss. 1, pp. 769-778
Open Access | Times Cited: 1
R. Subashini, R. Hemalatha, K Muthumeenakshi
International Journal of Computing and Digital Systems (2023) Vol. 14, Iss. 1, pp. 769-778
Open Access | Times Cited: 1
A Systematic Review of Textile Anomaly Detection Systems
Ananya Doshi, Vansh Dodiya, Hetansh Shah, et al.
2020 IEEE International Students' Conference on Electrical,Electronics and Computer Science (SCEECS) (2024), pp. 1-6
Closed Access
Ananya Doshi, Vansh Dodiya, Hetansh Shah, et al.
2020 IEEE International Students' Conference on Electrical,Electronics and Computer Science (SCEECS) (2024), pp. 1-6
Closed Access
Research on Fabric Defect Detection Algorithm Based on Improved YOLOv5
Zewei Zhao, Xiaotie Ma, Xiaotong Yang, et al.
2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ) (2024), pp. 387-391
Closed Access
Zewei Zhao, Xiaotie Ma, Xiaotong Yang, et al.
2022 IEEE 6th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC ) (2024), pp. 387-391
Closed Access
Vastradarpana A Novel Method to Detect Saree Using Image Processing Techniques
Yogesh BS
INTERANTIONAL JOURNAL OF SCIENTIFIC RESEARCH IN ENGINEERING AND MANAGEMENT (2024) Vol. 08, Iss. 04, pp. 1-5
Open Access
Yogesh BS
INTERANTIONAL JOURNAL OF SCIENTIFIC RESEARCH IN ENGINEERING AND MANAGEMENT (2024) Vol. 08, Iss. 04, pp. 1-5
Open Access
A Novel Deep Learning Approach to Detect Manufacturing Defects over Textile Fabric Materials
T.D. Subha, Pavaiyarkarasi Pavaiyarkarasi, S. Vijayalakshmi, et al.
2022 International Conference on Advances in Computing, Communication and Applied Informatics (ACCAI) (2023), pp. 1-9
Closed Access
T.D. Subha, Pavaiyarkarasi Pavaiyarkarasi, S. Vijayalakshmi, et al.
2022 International Conference on Advances in Computing, Communication and Applied Informatics (ACCAI) (2023), pp. 1-9
Closed Access
