OpenAlex Citation Counts

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OpenAlex is a bibliographic catalogue of scientific papers, authors and institutions accessible in open access mode, named after the Library of Alexandria. It's citation coverage is excellent and I hope you will find utility in this listing of citing articles!

If you click the article title, you'll navigate to the article, as listed in CrossRef. If you click the Open Access links, you'll navigate to the "best Open Access location". Clicking the citation count will open this listing for that article. Lastly at the bottom of the page, you'll find basic pagination options.

Requested Article:

Modeling and SPICE Simulation of the CdS/CdTe Neutron Detectors Integrated With Si-Poly TFTs Amplifiers
Carlos A. Hernández‐Gutiérrez, Carlos Ávila-Avendaño, Horacio I. Solís-Cisneros, et al.
IEEE Transactions on Nuclear Science (2022) Vol. 69, Iss. 6, pp. 1310-1315
Closed Access | Times Cited: 5

Showing 5 citing articles:

IoT-Enabled System for Detection, Monitoring, and Tracking of Nuclear Materials
Carlos A. Hernández‐Gutiérrez, Marcelo Delgado-del-Carpio, Lizette A. Zebadúa-Chavarría, et al.
Electronics (2023) Vol. 12, Iss. 14, pp. 3042-3042
Open Access | Times Cited: 7

Isotropic TFT Characteristics in the {100}-Oriented Grain-Boundary-Free Laser-Crystallized Si Thin Films
Nobuo Sasaki, Satoshi Takayama, Rikuto Sasai, et al.
Crystals (2023) Vol. 13, Iss. 1, pp. 130-130
Open Access | Times Cited: 4

High-Performance Amorphous InGaSnO Thin-Film Transistor with ZrAlOx Gate Insulator by Spray Pyrolysis
Yeoungjin Chang, Ravindra Naik Bukke, Youngoo Kim, et al.
Electronics (2023) Vol. 12, Iss. 3, pp. 688-688
Open Access | Times Cited: 4

Influence of Channel Surface with Ozone Annealing and UV Treatment on the Electrical Characteristics of Top-Gate InGaZnO Thin-Film Transistors
Changyong Oh, Taehyeon Kim, Myeong Woo Ju, et al.
Materials (2023) Vol. 16, Iss. 18, pp. 6161-6161
Open Access | Times Cited: 4

2022 Index IEEE Transactions on Nuclear Science Vol. 69

IEEE Transactions on Nuclear Science (2022) Vol. 69, Iss. 12, pp. 1-62
Open Access

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